Robust measurement of flexoelectro-optic switching with different surface alignments
Published in Journal of Applied Physics, 2019
Sandford O’Neill, J. J., Fells, J. A. J., Welch, C., Mehl, G., Yip, W. C., Wilkinson, T. D., Booth, M. J., Elston, S. J., Morris, S. M., "Robust measurement of flexoelectro-optic switching with different surface alignments." Journal of Applied Physics, 125, 093104 (2019) http://dx.doi.org/10.1063/1.5086241
The alignment of chiral nematic liquid crystals in the so-called uniform lying helix geometry allows for the observation and exploitation of the flexoelectro-optic effect. However, high-quality uniform lying helix alignment is difficult to achieve reliably, and this can potentially impact the accuracy of the measurements made on the flexoelectro-optic switching behaviour. Here, we show that, using an appropriate method, it is possible to make measurements of the flexo-electric coefficients that are not substantially influenced by the alignment quality.